Die

Phoenix Semiconductor are able to offer a large range of transistor die for use by hybrid manufacturers with a selection of small signal, small signal RF and power transistors.

This die is inspected at 40x and 100x magnifacation for any processing defects as per MIL-STD-883 and can be supplied either sawn in waffle trays or in wafer form.

All die are 100% DC probed at 25oC with a 10% LTPD sample taken to control all electrical parameters that cannot be tested during wafer probe.

Other options avaiable

  • SEM qualifaction of die lots to MIL-PRF-883 Method 2018
  • Contact resistance measurements
  • High Temperature Reverse Bias
  • Operating Life
Geometry Polarity Compatible
0003 NPN 2N918, 2N918UB, 2N3960, 2N3960UB
0005 NPN 2N2369A, 2N2369AUB, 2N3227, 2N3227UB, 2N4449
0011 NPN 2N2857, 2N2857UB
0307 NPN 2N930, 2N2919, 2N2920, 2N2484, 2N2484UB
0400 NPN 2N2218, 2N2218A, 2N2218AL, 2N2219, 2N2219A, 2N2219AL, 2N2222A, 2N2222AUB, 2N5581, 2N5582, 2N6989, 2N6990
410 NPN 2N2060
806 NPN 2N3735, 2N3735L, 2N3737, 2N3737UB
1008 NPN 2N3866UB, 2N3866A, 2N3866AUB
1009 NPN 2N5109, 2N5109UB
1031 NPN 2N5660, 2N5661, 2N5662, 2N5663
1506 NPN 2N3506, 2N3506L, 2N3506A, 2N3506AL, 2N3507, 2N3507L, 2N3507A, 2N3507AL
3101 NPN 2N4150, 2N4150S
3111 NPN 2N5237, 2N5238
4500 NPN 2N720A, 2N1893, 2N1893S, 2N3019, 2N3019S, 2N3057A, 2N3700, 2N3700UB
5620 NPN 2N3498, 2N3498L, 2N3499, 2N3499L, 2N3500, 2N3500L, 2N3501, 2N3501L, 2N3501UB
9201 NPN 2N3996, 2N3997, 2N3998, 2N3999, 2N5152, 2N5152L, 2N5154, 2N5154L, 2N5339
9202 NPN 2N5002, 2N5004
9221 NPN 2N5664, 2N5666, 2N5666S
9351 NPN 2N5038, 2N5039
Geometry Polarity Compatible Transistors
0006 PNP 2N4957, 2N4957UB
0014 PNP 2N4261, 2N4261UB
220 PNP 2N3810, 2N3810L, 2N3811, 2N3811L, 2N2605
0600 PNP 2N2904, 2N2904A, 2N2904AL, 2N2905, 2N2905A, 2N2905AL, 2N2906A, 2N2906AUB, 2N2907A, 2N2907AUB, 2N3485A, 2N3486A, 2N6987, 2N6988
6700 PNP 2N4029, 2N4033, 2N4033UB
9700 PNP 2N6193
9701 PNP 2N5003, 2N5005
9702 PNP 2N5151, 2N5151L, 2N5153, 2N5153L